JPH0620124Y2 - ガス分析計のサンプリング装置 - Google Patents
ガス分析計のサンプリング装置Info
- Publication number
- JPH0620124Y2 JPH0620124Y2 JP1985146071U JP14607185U JPH0620124Y2 JP H0620124 Y2 JPH0620124 Y2 JP H0620124Y2 JP 1985146071 U JP1985146071 U JP 1985146071U JP 14607185 U JP14607185 U JP 14607185U JP H0620124 Y2 JPH0620124 Y2 JP H0620124Y2
- Authority
- JP
- Japan
- Prior art keywords
- gas
- scrubber
- comparative
- gas line
- sampling device
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 238000005070 sampling Methods 0.000 title claims description 9
- 230000000052 comparative effect Effects 0.000 claims description 20
- 238000005259 measurement Methods 0.000 claims description 14
- 238000011144 upstream manufacturing Methods 0.000 claims description 9
- 239000007789 gas Substances 0.000 description 80
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 10
- XKRFYHLGVUSROY-UHFFFAOYSA-N Argon Chemical compound [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 description 4
- 239000003463 adsorbent Substances 0.000 description 4
- 229910052757 nitrogen Inorganic materials 0.000 description 4
- 230000003647 oxidation Effects 0.000 description 4
- 238000007254 oxidation reaction Methods 0.000 description 4
- 239000003054 catalyst Substances 0.000 description 3
- 239000012535 impurity Substances 0.000 description 3
- 239000011261 inert gas Substances 0.000 description 3
- 239000007800 oxidant agent Substances 0.000 description 3
- 229910052786 argon Inorganic materials 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 229910001873 dinitrogen Inorganic materials 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- 239000004065 semiconductor Substances 0.000 description 2
- 229910052724 xenon Inorganic materials 0.000 description 2
- FHNFHKCVQCLJFQ-UHFFFAOYSA-N xenon atom Chemical compound [Xe] FHNFHKCVQCLJFQ-UHFFFAOYSA-N 0.000 description 2
- 238000006243 chemical reaction Methods 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 230000001590 oxidative effect Effects 0.000 description 1
- 238000011002 quantification Methods 0.000 description 1
Landscapes
- Sampling And Sample Adjustment (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1985146071U JPH0620124Y2 (ja) | 1985-09-24 | 1985-09-24 | ガス分析計のサンプリング装置 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1985146071U JPH0620124Y2 (ja) | 1985-09-24 | 1985-09-24 | ガス分析計のサンプリング装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS6253343U JPS6253343U (en]) | 1987-04-02 |
| JPH0620124Y2 true JPH0620124Y2 (ja) | 1994-05-25 |
Family
ID=31058196
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1985146071U Expired - Lifetime JPH0620124Y2 (ja) | 1985-09-24 | 1985-09-24 | ガス分析計のサンプリング装置 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0620124Y2 (en]) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP5289837B2 (ja) * | 2008-06-30 | 2013-09-11 | 日本光電工業株式会社 | 生体由来ガス成分分析装置及び疾病判定支援装置 |
Family Cites Families (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS56101534A (en) * | 1980-01-18 | 1981-08-14 | Horiba Ltd | Dehumidifier in gas analyzing device |
| JPS5815138A (ja) * | 1981-07-21 | 1983-01-28 | Fuji Electric Co Ltd | ガス分析装置 |
-
1985
- 1985-09-24 JP JP1985146071U patent/JPH0620124Y2/ja not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| JPS6253343U (en]) | 1987-04-02 |
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